Benning ST 755+ BTEC set. Device tester for testing electrical devices/work equipment in accordance with DIN EN 50678 (VDE 0701), DIN EN 50699 (VDE 0702), DGUV regulation 3 and medical electrical devices in accordance with DIN VDE 0751-1, DIN EN 62353, such as hospital/care beds. Display graphically. Limit display yes. Measurements: Insulation resistance measuring range 0.1 MOhm - 100 MOhm. Nominal test voltage 100 V. Nominal test voltage 250 V. Nominal test voltage 500 V. Nominal voltage 1000 V. Adjustable. Protective conductor resistance measuring range 0.05 ohm - 10 ohm. Test current 600 mA/10A. Replacement leakage current, yes. Differential current yes. Direct measurement, yes. Protective conductor current, yes. Touch current yes. Protective conductor/touch current 0.03 mA - 25 mA. Consumer current measurement, yes. Performance measurement, yes. Functional test V/A/W in the True RMS real effective value measurement method. Testing mobile PRCDs and type AC/A/F/B/B+. Connection for external measuring adapters, yes. Testing 3-phase consumers using optional measuring adapters. Additional measuring adapters optionally available. Checking extension cables, yes. Device leakage current, leakage current from applied part types B, BF and CF. Special features: Brilliant 7 inch color touch display (35% larger user interface) with innovative menu functions for simple and efficient initial testing/creation of new test items. Smart menu functions: Individually adaptable device templates (24 templates per test standard) for quick creation of test items using a single keystroke, Auto-ID function for automatic incrementing of the identification number (ID) when creating new test items, individually via ON/OFF Slider displayable device data for optimized handling and use by EUPs. Favorites menu for direct jump to frequently used submenus. Softkey keyboard (QWERTZ), graphic fields describe the predefined functions. Automatic test procedure, yes. Automatic and manual test sequence with good/bad display. Measured value memory, yes. Complete test object database including test history can be saved on SD card/USB stick. Interface version WLAN, Bluetooth, 4 x USB Type A, 1 x mini-USB, 1 x RJ 45, 1 x SD card slot. Printer port USB-A. Free updates. Battery-supported user interface, e.g. B. in the event of a power failure, transport from test location to test location, access to SD card possible. Active testing yes. Passive testing, yes. Alternative method yes. Differential current method yes. Direct method yes. Voltage measurement, yes. Dimensions length 405 x width 330 x depth 165 mm. Weight: 6kg. Test device in a robust protective case (IP67), self-compensating test lead, 4 mm measuring lead, test tip, alligator clip set, cold device lead, SD card, BTEC Smart 1 year - 100% voucher, barcode scanner, barcode labels 1000 pieces, test stickers 300 pieces, calibration certificate.
Properties
Manufacturer: Benning
Description: Device tester BTEC set
Type: BENNINGST760+BTECSET
Display: graphic
Limit display: yes
Insulation resistance measuring range: 0.1..100 Mohm
Protective conductor resistance measuring range: 0.05..10 Ohm
Protective conductor current: yes
Touch current: yes
Consumer current measurement: yes
Performance measurement: yes
Leakage current measurement DC: yes
Tripping time measurement of (P)RCDs: yes
Connection for external measuring adapter: yes
Testing extension cables: yes
Automatic test sequence: yes
Measured value memory: yes
Printer integrated: no
Active testing: yes
Passive test: yes
Alternative method: yes
Differential current method: yes
Direct method: yes
Voltage measurement: yes
Suitable for use by an instructed person: yes
Interface version: Wi-Fi
Printer port: USB-A
Test according to EN 50678: yes
Test according to EN 50699: yes
Test according to EN 62638: no
Test according to EN 62911: no
Testing according to IEC/EN 60974-4: yes
Testing according to IEC/EN 62353: yes
Entering test item information: yes
Testing according to VDE 0701: yes
Test according to VDE 0702: yes
Test according to VDE 0701/0702: no
Testing according to VDE 0751: yes
Testing according to VDE 540-4: yes.